W Series by Ideal Vision Integration provides a high throughput and reliable inspection on defects for various wafer types with high resolution color 2D imaging and fully automated wafer handling mechanisms. Ideal Vision’s patented HDCompozite™ combines both 2D imaging and 3D metrology to deliver an exceptional inspection for bump height as an optional enhancement. The system is also powered by JÄGER® vision software that designed for high speed and precise vision inspection application.
Automatic Loading and Unloading
Support Dual Inspection Station
Image Processing Capability
Comprehensive Vision Inspection Tools
High Definition Composite 3D Inspection*