WAFER AOI

W Series by Ideal Vision Integration provides a high throughput and reliable inspection on defects for various wafer types with high resolution color 2D imaging and fully automated wafer handling mechanisms. Ideal Vision’s patented HDCompozite™ combines both 2D imaging and 3D metrology to deliver an exceptional inspection for bump height as an optional enhancement. The system is also powered by JÄGER^®  vision software that designed for high speed and precise vision inspection application.

Features:

• Modular Design
• Automatic Loading and Unloading
• Wafer Pre-Alignment
• Support Dual Inspection Station
• Image Processing Capability
• Comprehensive Vision Inspection Tools
• High Definition Composite 3D Inspection*
• Artificial Intelligent*