
Intelligent Wafer AOI Machine 2024

Sigma Series
INTELLIGENT WAFER AOI MACHINE
A high throughput and reliable inspection on defects for various wafer types with high resolution color 2D imaging and fully automated wafer handling mechanisms. Ideal Vision’s patented HDCompozite™ combines both 2D imaging and 3D metrology to deliver an exceptional inspection for bump height as an optional enhancement. The system is also powered by JÄGER® vision software that is designed for high speed and precise vision inspection application.
Features:
- Modular Design
- Image Processing Capability
- Wafer Pre-Alignment
- Colour Camera with RGB Lighting
- Support Dual Inspection Station
- JӒGER® with Comprehensive Vision Inspection Tools
- SECS/GEM Ready
- Patented HDCompozite™ 3D Inspection*
- Artificial Intelligence*