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Sigma Series

INTELLIGENT WAFER AOI MACHINE

A high throughput and reliable inspection on defects for various wafer types with high resolution color 2D imaging and fully automated wafer handling mechanisms. Ideal Vision’s patented HDCompozite™ combines both 2D imaging and 3D metrology to deliver an exceptional inspection for bump height as an optional enhancement. The system is also powered by JÄGER® vision software that is designed for high speed and precise vision inspection application.

Features:

  • Modular Design
  • Image Processing Capability
  • Wafer Pre-Alignment
  • Colour Camera with RGB Lighting
  • Support Dual Inspection Station
  • JӒGER® with Comprehensive Vision Inspection Tools
  • SECS/GEM Ready
  • Patented HDCompozite™ 3D Inspection*
  • Artificial Intelligence*
Intelligent Wafer AOI Machine Defects
Contact us for more information